Oscillating quartz atomic force microscope

Details Oscillating quartz atomic force microscope Oscillating quartz atomic force microscope

G - Physics

01

L

341/97

G01L 1/08 (2006.01) G01B 7/34 (2006.01) G01B 21/30 (2006.01) G01L 1/16 (2006.01) G01N 23/00 (2006.01) H01J 37/26 (2006.01)

Patent

CA 1330452

ABSTRACT This atomic force microscope comprises a pointed tip (1) mounted on top of an oscillating crystal (2) which is translatable In xyz-directions by a conventional xyz-drive (4). A potential applied to a pair of electrodes (5, 6) coated on opposite faces of said crystal (2) causes the latter to oscillate with its resonance frequency. As the tip (1) is approached to a surface to be investigated, the frequency of oscillation of the crystal deviates from its original frequency. This deviation can be used in a feedback loop to control thedistance in z-direction of the tip (1) from the surface being investigated and to plot an image of the contour of each scan performed by the tip (1) across the surface.

565615

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