Probe for testing electronic components

Details Probe for testing electronic components Probe for testing electronic components

G - Physics

01

R

324/74.2

G01R 1/06 (2006.01) G01R 1/067 (2006.01) G01R 1/073 (2006.01) H05K 13/08 (2006.01)

Patent

CA 1284181

Abstract of the Disclosure A probe for electrically contacting a lead of an electronic component providing accurate spacing between tip portions by using an insulator guide having holes through it and positioning wires in the holes so that tip portions of the wires extend from a probe surface.

568014

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