Method and apparatus for testing materials after the eddy...

Details Method and apparatus for testing materials after the eddy... Method and apparatus for testing materials after the eddy...

G - Physics

01

N

324/50

G01N 27/90 (2006.01)

Patent

CA 1195733

ABSTRACT OF THE DISCLOSURE A method and an apparatus for testing materials based on the eddy current principle enables a better exploi- tation of the sensitivity of measurement. At first the com- plex data appearing during a test cycle are examined as to whether only distrurber signals, distruber signals in con- nection with flaw signals, or only flaw signals are present. By means of this testing the complex data are further pro- cessed directly if thee are flaw signals only, or are sub- miteed to a distruber signal elimination. The direct fur- ther processing as well as the further processing made after elimination of the distruber signal comprises the determina- tion of the type of flaw. Subsequently the depth of flaw is determined.

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