Flaw detector

Details Flaw detector Flaw detector

G - Physics

01

N

340/124.6

G01N 21/90 (2006.01) G06T 7/00 (2006.01)

Patent

CA 1195407

FLAW DETECTOR Abstract of the Disclosure Container flaws are detected by repetitively sampling the output of a photosensor at a controlled rate dependent on the speed of inspection. Samples are digitized and stored in memory on a first in, first out basis. First in (oldest) and last in (newest) samples are used to provide a sliding computation of the slope or rate of change of the photosensor output. The computed slope is compared to an empirically determined preselected number. Con- tainers are rejected or accepted based on the results of the comparison.

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