G - Physics – 01 – R
Patent
G - Physics
01
R
324/37
G01R 31/28 (2006.01) G01R 27/28 (2006.01)
Patent
CA 1224845
Abstract of the Disclosure A frequency domain characteristic of a system under test (SUT) is measured by using a digital signal corresponding to a swept frequency analog signal. In the case of a digital SUT, the digital signal is applied to the SUT, the output signal from the SUT is converted to analog form, and a measure of the peak- to-peak amplitude of the analog signal is derived. In the case of an analog SUT,the digital signal is con- verted to digital form, the analog signal is applied to the SUT, and a measure of the peak-to-peak ampli- tude of the ouput signal from the SUT is derived. Figure 1.
424902
Kirby Eades Gale Baker
Tektronix Inc.
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