G - Physics – 01 – R
Patent
G - Physics
01
R
356/117
G01R 31/28 (2006.01) G01R 31/3185 (2006.01)
Patent
CA 1257012
ABSTRACT A description is given of the testing of an inter- connection function between two integrated circuits which are mounted on a carrier and which are interconnected by data connec- tions for example a printed wiring board. The integrated cir- cuits are also connected to a serial bus via which test patterns and result patterns can be communicated between a test device which can be connected thereto and the respective integrated circuits. The bus of a preferred embodiment is formed by a so- called I2C bus. In a further elaboration, this set-up can also be used for testing the internal logic circuitry of the inte- grated circuits. For the testing of the interconnection function, there are provided input/output cells with a parallel connection for performing the normal execution function in a transparent mode. They also include series connections for communication test/result patterns in the way of a shift register.
517650
Beenker Franciscus P.m.
de Wilde Johannes
Sauerwald Wilhelm A.
Segers Marinus T.m.
Van Eerdewijk Karel J.e.
Fetherstonhaugh & Co.
Koninklijke Philips Electronics N.v.
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