Monolithic microwave integrated circuit with pads for...

H - Electricity – 01 – L

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356/117, 356/146

H01L 23/50 (2006.01) H01L 23/58 (2006.01) H01L 23/66 (2006.01)

Patent

CA 1213681

MONOLITHIC MICROWAVE INTEGRATED CIRCUIT WITH PADS FOR MEASURING DC CHARACTERISTICS Abstract of the Disclosure: In monolithic microwave integrated circuits of resistance-capacitance construction, selection after produc- tion can be easily performed without sacrificing high frequency characteristics by adding thereto composing pads such as pads for signal, pads for power source, pads for bias and the like and pads for measuring and selecting direct current characteristics. Further, said monolithic microwave integrated circuits added with pads for measuring and selecting direct current characteristics can be easily selected by probing them on wafers.

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