Test system with shared test instruments

Details Test system with shared test instruments Test system with shared test instruments

G - Physics

01

R

324/59

G01R 31/28 (2006.01) G01R 31/319 (2006.01)

Patent

CA 1268818

TEST SYSTEM WITH SHARED TEST INSTRUMENTS Abstract of the Disclosure A plurality of units under test (UUTs) are coupled to a plurality of programmable test instruments via a switching network, whereby the test instruments are shared by test stations each associated with a respective UUT. The test stations communicate with a processor via respective serial ports to execute test programs for testing UUTs. The processor controls the switching network via a parallel port to set up desired connections, and programs the test instruments, via a bus interface and a bus to which all of the test instruments are coupled, for performing desired tests, in dependence upon the respective test program. The switching network is made up of switching modules. Each test station can include a bar code reader for reading information from the respective UUT.

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