Computer program-controlled contour inspection method

Details Computer program-controlled contour inspection method Computer program-controlled contour inspection method

G - Physics

05

B

354/25

G05B 19/25 (2006.01) G01B 7/008 (2006.01)

Patent

CA 1210868

COMPUTER PROGRAM-CONTROLLED CONTOUR INSPECTION METHOD Abstract A computer program controlled inspection process for a surface of a workpiece mounted on an inspection table beneath a stylus or probe of an electromechanical transducer wherein dimensions and configurations along the surface of the workpiece are inspected in a predetermined path and compared with the preprogrammed dimensions and configuration heights. An outline of the workpiece and any out-of-tolerance dimensions are printed by an associated printer, and the cross-sectional shape of any selected configuration may be shown on a cathode ray tube screen. The configuration may, for example, consist of a scoreline or an edge.

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