Time measurement in automatic test equipment

Details Time measurement in automatic test equipment Time measurement in automatic test equipment

G - Physics

01

R

324/58, 58/0.2

G01R 31/28 (2006.01) G01R 23/02 (2006.01) G01R 31/3193 (2006.01) G04F 10/04 (2006.01)

Patent

CA 1293863

Abstract of the Disclosure Apparatus for automatically testing electronic circuits and performing time measurements, including a time measuring circuit for counting clock pulses provided between stop and start event edges presented to it, two independent input selectors for each selectively connecting one of a plurality of its inputs to the time measuring circuit, and a plurality of local comparators located within the test apparatus near sources of signals to be timed and generating an event edge upon receiving a signal crossing a threshold value. Also dislcosed are making time measurements of signals at digital and analog pins using local comparators connected to input selectors over deskewed transmission paths and connecting a local comparator to the filter output of an analog instrument.

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