Method and apparatus for testing of electrical...

Details Method and apparatus for testing of electrical... Method and apparatus for testing of electrical...

G - Physics

01

R

324/45

G01R 31/28 (2006.01) G01R 27/02 (2006.01) G01R 31/08 (2006.01)

Patent

CA 1216630

Abstract A method and apparatus for testing circuit boards using two or a small number of probes for making resistive and radio frequency impedance measurements e.g. capacitive measurements. The combination of resistive and impedance measurements substantially reduces the number of tests required to verify the integrity of a circuit board. The impedance or capacitive "norm" values used in testing the circuit boards can be obtained by operating the system in a learning mode. Analysis of the data provides not only fault detection but also can indicate approximate fault location.

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