G - Physics – 01 – N
Patent
G - Physics
01
N
350/32, 354/55
G01N 33/44 (2006.01) G01B 11/30 (2006.01) G01N 15/14 (2006.01)
Patent
CA 1235513
TITLE METHOD OF FILM INSPECTION WITH A MICROSCOPICAL IMAGE ANALYZER ABSTRACT OF THE DISCLOSURE An automated system is used for the inspection of a transparent film which has been metallized by vaporizing a metal so that it impacts the film's surface at a preselected angle, wherein the metallized film sample is illuminated with a light source, and the transmitted light is passed through a microscope to a video camera, which produces a videoscan. The videoscan is digitized, stored in a computer memory, and processed pixel by pixel by the computer which calculates asperity height distribution from the number and lengths of metallizing shadows caused by asperities on the film surface. This method is especially useful for inspecting film to be used for recording devices, especially for video tapes, where accurate information on the asperity height distribution is required.
488114
Jansson Peter A.
Merrill Michael J.
Owens Daniel K.
Rubin Barry
Dupont Teijin Films U.s. Limited Partnership
Mccallum Brooks & Co.
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