Method of measuring a mode partition characteristics of a...

G - Physics – 01 – J

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

354/29, 73/51

G01J 1/00 (2006.01) H01S 5/00 (2006.01)

Patent

CA 1287233

ABSTRACT An apparatus and a method for measuring mode partition characteristics, of a laser diode with so-called a k-value (k factor) are described. A PN (Pseudo Noise) pulse pattern is used for the modulation of the laser diode to be measured and various parameters required for calculation of the k value are measured using a pseudo noise pulse pattern generator gives results which are more realistic.

531084

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Method of measuring a mode partition characteristics of a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of measuring a mode partition characteristics of a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring a mode partition characteristics of a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1323681

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.