Test system for electronic devices with radio frequency...

G - Physics – 01 – R

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324/58.1

G01R 31/28 (2006.01) G01R 31/312 (2006.01) G06F 11/277 (2006.01)

Patent

CA 1283450

53,561 ABSTRACT OF THE DISCLOSURE A test system for comparatively analyzing a complex signal indicative of the operational status of an electronic device to be tested includes means for sampling a signal whose characteristics are indicative of the unknown operational status of the electronic device to produce a comparison data base. The comparison data base is processed to produce comparison transform coefficients. These transform coefficients are compared with a set of reference transform coefficients, representative of a desired operational status of the device, to determine the actual operational status of the device. The sampling means includes a conductive element capacitively coupled to the device and permanently mounted in a fixed spatial relationship with the device.

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