G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 11/30 (2006.01) G01N 33/34 (2006.01)
Patent
CA 2646683
A method of measuring the quality, in particular the roughness, of a surface of a substrate (25) is described. The method includes the steps of obtaining a digital image (70) of a portion of a surface of the substrate using an image obtaining apparatus (20); and measuring the luminescence of each pixel of the obtained digital image so as to provide an indication of the quality of the surface of the substrate, and to predict printing performance.
L'invention concerne un procédé de mesure de la qualité d'une surface d'un substrat. Le procédé comprend les étapes consistant: à obtenir une image numérique d'une partie d'une surface du substrat en utilisant un appareil d'obtention d'images; et à mesurer une ou plusieurs caractéristiques physiques de l'image numérique obtenue de manière à fournir une indication sur la qualité de la surface du substrat.
Borden Ladner Gervais Llp
Verity Ia Llc
LandOfFree
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