G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 35/10 (2006.01) G01N 35/02 (2006.01)
Patent
CA 2594085
A method for metering samples located in a metering zone of a diagnostic analyzer includes: providing samples located within the metering zone on the analyzer; providing a metering system having a robotic arm which is extendable from a linearly translatable pivot. The arm accesses multiple sample points in the metering zone. The robotic arm is moved to position a metering probe located on the end of the arm distal from the pivot point over the sample. The probe moves vertically relative to the sample in the direction of the sample and aspirates the sample. A metering system for a diagnostic analyzer includes: a truck mounted on a guide rail, said truck linearly movable along the guide rail; a robotic arm pivotably attached and extending away from the truck, the robotic arm being rotatable in a plane that is horizontal and parallel to the line of linear motion of the truck; a metering head having a probe thereon for aspirating and dispensing a liquid, the metering head is attached to the robotic arm. At least one of the metering head or robotic arm is movable in a vertical direction to lower the probe. In a preferred embodiment, the guide rail extends along the rear of the analyzer and the arm extends in front of the guide rail. In another preferred embodiment, a second metering system is provided.
Barnes Lawrence
Denton Gary
Norton Rose Or S.e.n.c.r.l. S.r.l./llp
Ortho-Clinical Diagnostics Inc.
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