Method and apparatus for x-ray diffraction analyses

G - Physics – 01 – N

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G01N 23/20 (2006.01) G01N 23/207 (2006.01) G01N 33/38 (2006.01)

Patent

CA 2375244

A method and apparatus for continuously presenting a sample from a stream of particulate material which contains crystalline substances and effectively continuously analysing the sample by X- ray diffraction. An extracted sample flow (23-22-24) is fed onto a continuously moving carrier (10-12) and its surface smoothed and flattened (25-26-30-32) for X-ray diffraction patterns to be detected (34-36) and analysed (38) to provide a compositional analysis for the crystalline substances. The sample (24) is continuously removed (40) from the carrier (10) prior to further sample being fed onto the carrier. The invention is particularly applicable for phase composition analysis of cement and cement clinker and provides and effectively continuous analysis substantially in real time in contrast to prior art laboratory analysis of discrete samples.

Procédé et dispositif servant à présenter en continu un échantillon provenant d'un écoulement de matériau en particules contenant des substances cristallines et à analyser en continu cet échantillon par cristallographie aux rayons X. On alimente un support (10-12) en déplacement continu en une succession d'échantillons extraits (22, 23, 24), puis on lisse et on aplatit la surface de ces échantillons (25, 26, 30, 32) afin de détecter (34, 36) et d'analyser (38) des configurations par cristallographie aux rayons X, de manière à obtenir une analyse de la composition de ces substances cristallines. On retire en continu l'échantillon (24) du support (10) avant d'alimenter ce dernier en d'autres échantillons. Cette invention est particulièrement appropriée pour une analyse de composition de phase de ciment et de clinker de ciment et permet d'effectuer une analyse en continu pratiquement en temps réel contrairement aux analyses de l'état actuel de la technique exécutées en laboratoire sur des échantillons discrets.

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