Method of analyzing polymer by using laser abrasion and...

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G01N 27/64 (2006.01) H01J 49/10 (2006.01) H01J 49/16 (2006.01) H01J 49/40 (2006.01)

Patent

CA 2439481

It becomes possible to simultaneously atomize and ionize atoms constituting a polymer with the use of a single laser, thereby highly simplifying the constitution of a system. A method of analyzing a polymer which comprises abrading the polymer to be analyzed by irradiating with laser beams to thereby atomize the polymer into the constituting elements thereof, then ionizing the elements and analyzing the constituting elements thus ionized. The laser beams with which the polymer to be analyzed is irradiated for the abrasion are ultrashort pulse laser beams. By irradiating the polymer with the ultrashort pulse laser beams to thereby abrade, the polymer can be atomized and ionized at the same time. Then the thus ionized constituting elements are analyzed.

L'invention concerne un procédé qui permet de pulvériser et d'ioniser simultanément des atomes constituant un polymère à l'aide d'un seul laser, ce qui simplifie le système. L'invention concerne en particulier un procédé d'analyse d'un polymère qui consiste à assurer l'abrasion du polymère en l'irradiant à l'aide de faisceaux laser pour pulvériser ce polymère en éléments constitutifs de ce dernier, puis ioniser ces éléments avant de les analyser. Les faisceaux laser qui sont projetés sur le polymère à analyser sont des faisceaux laser à impulsions ultracourtes. En irradiant le polymère à l'aide de ces faisceaux, le polymère peut être pulvérisé et ionisé en même temps. Ainsi, les éléments constitutifs ionisés sont analysés.

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