Device for analyzing a transient waveform

Details Device for analyzing a transient waveform Device for analyzing a transient waveform

G - Physics

06

F

354/137

G06F 17/40 (2006.01)

Patent

CA 2026257

A device for analyzing a transient waveform of the present invention is provided with a computation unit which analyzes the observed transient response waveform as an input adaptive type autoregressive model consisting of a linear function of regressive coefficients dependent upon material parameters or upon material parameters and material spectra. It can perform a rapid and accurate analysis of the transient response waveform observed through the incidence of pulse laser beams, promoting searches into the prime process of material changes.

Affiliated with

Also associated with

Rating

Device for analyzing a transient waveform does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device for analyzing a transient waveform, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for analyzing a transient waveform will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1428858