Product defect detection using thermal ratio analysis

Details Product defect detection using thermal ratio analysis Product defect detection using thermal ratio analysis

G - Physics

01

N

G01N 25/00 (2006.01) G01N 25/72 (2006.01)

Patent

CA 2047426

ABSTRACT OF THE DISCLOSURE A method and apparatus for indicating defects in manufactured products employs, instead of the conventional thermal image subtraction, "thermal ratio analysis", which involves ratios of thermal data and their analysis including statistical analysis. Various techniques for "image" enhancement and for suppression of known artifacts are employed to facilitate the decision as to when a defect is detected. The thermal ratio analysis technique is particularly useful for detecting hidden defects in electronic circuitry, such as integrated circuits.

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