G - Physics – 06 – K
Patent
G - Physics
06
K
G06K 9/20 (2006.01) A61B 5/117 (2006.01) G01K 7/01 (2006.01)
Patent
CA 2581230
Apparatus for measuring a pattern in a surface of an object, comprising a plurality of pixel or sensor elements being responsive to a physical parameter of the object surface, and means for establishing an overall, segmented picture related to said pattern, and also comprising at least one diode functionally associated with each sensor element for contributing to one or more of the following functions: selectively addressing said sensor element; activating said sensor element; and sensing of said physical parameter.
L~invention concerne un appareil pour mesurer un motif sur une surface d~un objet, comprenant une pluralité d~éléments de pixel ou de capteur sensibles à un paramètre physique de la surface de l~objet, et des moyens pour établir une image segmentée, globale liée audit motif, et comprenant également au moins une diode associée fonctionnellement à chaque élément de capteur pour contribuer à une ou plusieurs des fonctions suivantes : adressage sélectif dudit élément de capteur ; activation dudit élément de capteur ; et détection dudit paramètre physique.
Borden Ladner Gervais Llp
Dinh Ngoc Minh
Next Biometrics Group As
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