Electro-emissive laser stimulated test

Details Electro-emissive laser stimulated test Electro-emissive laser stimulated test

G - Physics

01

R

356/2

G01R 31/28 (2006.01) G01R 31/308 (2006.01)

Patent

CA 2027190

ELECTRO-EMISSIVE LASER STIMULATED TEST ABSTRACT OF THE DISCLOSURE A test arrangement for printed wiring boards or the like employs a scanned laser beam which impinges upon a photoemissive grid mounted close to the board under test. The laser beam causes the grid to locally emit electrons which are attracted toward the board due to an electric field between the grid and a conductive plane behind the board. The spacing between the grid and the workpiece is very small so the electron beam is very localized and travels a short distance; there is no need for deflecting the electron beam, because it is the laser beam which is scanned. The charge transferred from the grid to the part under test by electron flow is detected and correlated with the position of the beam to provide an indication of the status of the conductive pattern. Undesired shorts or open circuit conditions among the conductors on the board is determined by comparing the charge transfer as a function of beam position with the desired standard pattern produced by a fault-free board.

Affiliated with

Also associated with

Rating

Electro-emissive laser stimulated test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electro-emissive laser stimulated test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electro-emissive laser stimulated test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1497159