Autofocus method and autofocus device

G - Physics – 02 – B

Patent

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Details

G02B 7/09 (2006.01) G02B 21/24 (2006.01)

Patent

CA 2755164

The invention is based on an autofocus method in which light from a light source (12) is focused at a measurement light focus (52) in a sample (6) and is reflected from there and the reflected light is guided through an optical system (22) in two light paths (48, 50) onto at least two detector elements (72, 74). In order to achieve fast and accurate automatic focusing on the sample, it is proposed that the measurement light focus (52) is moved in layers of the sample (6) which reflect light to different extents, and the detector elements (72, 74) are arranged in such a way that, in this case, profiles of a radiation property registered by the detector elements (72, 74) are different and a focus position is set in a manner dependent on the profiles.

La présente invention concerne un procédé d'autofocus avec lequel la lumière provenant d'une source de lumière (12) est focalisée dans un foyer de lumière de mesure (52) dans un échantillon (6) et est renvoyée depuis cet échantillon, un système optique (22) dirige la lumière renvoyée à travers deux chemins de lumière (48, 50) vers au moins deux éléments détecteurs (72, 74). Pour obtenir une focalisation rapide, précise et automatique sur l'échantillon, le foyer de lumière de mesure (52) est déplacé dans des couches de l'échantillon (6) qui renvoient la lumière avec une intensité différente, les éléments détecteurs (72, 74) étant disposés de sorte que des variations d'une propriété de rayonnement enregistrée par les éléments détecteurs (72, 74) soient différentes et qu'une position du foyer soit réglée en fonction des variations.

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