Methods and system for inspection of fabricated components

G - Physics – 01 – B

Patent

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G01B 21/20 (2006.01) G01B 5/20 (2006.01) F01D 5/30 (2006.01)

Patent

CA 2532935

Methods and apparatus for inspecting a component (29) are provided. The method includes receiving (408) a plurality of data points that define a shape of the component, fitting (410) the received data points to a curve that defines a predetermined model shape, and comparing (412) the received data points to the curve defining the predetermined model shape to determine a break radius of the component.

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