Method of contact-less measurement of two-layered...

G - Physics – 01 – B

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G01B 11/06 (2006.01)

Patent

CA 2659817

A method for the contact-less measurement of two-layered three-dimensional objects by single-view optical ombroscopy. According to the invention, in order to measure without contact a three-dimensional hollow object (32) that is translucent or transparent to visible light, an image of the object is acquired by single-view optical ombroscopy along a viewing axis (34) while examining said object under visible light and said image comprising at least one luminous line, an equation is established for relating at least one opto-geometrical parameter of the object with at least one geometrical parameter of the luminous line, the geometrical parameter is determined, and the opto-geometrical parameter is determined using the equation and the geometrical parameter thus determined.

Procédé de mesure sans contact d'objets tridimensionnels à deux couches par ombroscopie optique à une seule vue. Selon l'invention, pour mesurer sans contact un objet tridimensionnel creux (32), cet objet étant translucide ou transparent vis-à-vis d'une lumière visible, on acquiert une image de l'objet par ombroscopie optique à une seule vue, suivant un axe de vue (34), en observant cet objet avec la lumière visible, cette image comprenant au moins une ligne lumineuse, on établit une équation qui relie au moins un paramètre opto-géométrique de l'objet à au moins un paramètre géométrique de la ligne lumineuse, on détermine ce paramètre géométrique, et l'on détermine le paramètre opto-géométrique à l'aide de l'équation et du paramètre géométrique ainsi déterminé.

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