G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 21/31 (2006.01) G01B 9/02 (2006.01) G01N 21/17 (2006.01)
Patent
CA 2108422
DUAL INTERFEROMETER SPECTROSCOPIC IMAGING SYSTEM ABSTRACT OF THE DISCLOSURE To obtain spectra from the surface of a sample, a first of a pair of interferometers includes a broadband radiation source and modulates the radiation at a frequency which is inversely proportional to wavelength. The modulated radiation impinges on the surface of interest where it is absorbed. The absorption of radiation causes the surface of the sample to expand. This change in dimension is then detected by a second interferometer which employs a monochromatic radiation source to measure the instantaneous distance between the sample surface and the second interferometer. The detection system of the second interferometer can be an imaging device such as a video camera to obtain the spatial distribution of chemical composition of the sample surface.
Company General Electric
Craig Wilson And Company
LandOfFree
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