Process and circuitry for inspecting welding points

Details Process and circuitry for inspecting welding points Process and circuitry for inspecting welding points

G - Physics

01

N

G01N 23/04 (2006.01) G01N 23/18 (2006.01) G01R 31/304 (2006.01) H05K 13/08 (2006.01)

Patent

CA 2289721

A process and circuitry (SJTD) are disclosed for checking welding points for defects by means of X-rays generated by a device (I). Before the welding points are inspected, the values of predeterminable measurement parameters, such as height of a welding meniscus or rise of a grey scale value curve generated by the device (I), are determined for reference welding points. When the welding points are subsequently inspected, selected measurement parameters are evaluated.

L'invention concerne un procédé et un agencement de circuits (SJTD) pour contrôler des points de soudure et détecter des défauts au moyen de rayonnements X générés par un dispositif (I). Avant de contrôler les points de soudure, on détermine pour des points de soudure de référence les valeurs de paramètres prédéterminables de mesure, tels que la hauteur d'un ménisque de soudure et l'ascension d'une courbe de valeurs de gris générée par le dispositif. Lorsque, par la suite, on contrôle les points de soudure, on évalue des paramètres de mesure sélectionnés.

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