Method of matching patterns and apparatus therefor

Details Method of matching patterns and apparatus therefor Method of matching patterns and apparatus therefor

G - Physics

06

K

354/57

G06K 9/00 (2006.01) G06K 9/64 (2006.01) G06T 7/00 (2006.01)

Patent

CA 2033359

A method matching patterns includes the steps of optically scanning a master image and a to-be-recognized image and outputting master image data and to-be- recognized image data, extracting master outline data representing an outline of the master image from the master image data, extracting to-be-recognized outline data representing an outline of a to-be-recognized image from the to-be-recognized image data, performing an enlargement process for the to-be-recognized outline data to enlarge the to-be-recognized outline, thereby forming to-be-recognized outline data, and collating the master outline data with the to-be-recognized outline data, and if a portion of the master outline projects from the to-be-recognized outline, determining that the to-be-recognized image has a short-defect indicating an omission of the image.

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