Missile test method and apparatus

F - Mech Eng,Light,Heat,Weapons – 42 – B

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F42B 35/00 (2006.01) F41G 7/00 (2006.01)

Patent

CA 2177211

A missile (50) is tested by first stimulating the performance of missile (50) built-in tests that are stimulated in service by signals from the launch site, and which tests do not require internal access to the missile (50). If performance is satisfactory, no further testing is required. If a condition of unsatisfactory missile (50) performance is detected, an access cover (63) is removed, connections are made to internal sources of data, and the built-in tests are repeated in order to determine which internal components caused the unsatisfactory missile (50) performance. The component is repaired. The testing with the access cover (63) removed is repeated, and, if the performance is satisfactory, the access cover (63) is replaced and the testing with the access cover (63) present is repeated.

Un missile (50) est testé en activant d'abord des mécanismes d'essai de performance embarqués au moyen de signaux émis du site de lancement. Les essais réalisés par ces mécanismes ne nécessitent pas un accès à l'intérieur du missile (50). Si ces premiers essais sont satisfaisants, aucun autre n'est nécessaire. En cas de détection d'une anomalie de performance du missile (50), un panneau d'accès (63) est enlevé pour raccorder les sources internes de données à un appareil de contrôle, et les essais susmentionnés sont repris pour déterminer lequel ou lesquels des composants du missile est à l'origine de l'anomalie précédemment détectée. Le composant défectueux est réparé et les essais avec panneau d'accès (63) enlevé sont repris. Si les essais sont satisfaisants, le panneau (63) est remis en place et les essais sont encore une fois repris.

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