Integrated circuit device including scan-path testing function

Details Integrated circuit device including scan-path testing function Integrated circuit device including scan-path testing function

G - Physics

01

R

G01R 31/26 (2006.01) G01R 31/28 (2006.01) G06F 11/22 (2006.01) H01L 21/66 (2006.01)

Patent

CA 2271184

An integrated circuit device has a plurality of integrated circuits. Each of the integrated circuits includes a plurality of sequential circuits that constitute a scan-path in a test mode. The integrated circuit device includes a plurality of I/O pins and a test control circuit. The I/O pins are connected to each of the integrated circuits and are coupled to each other between the different integrated circuits via return wiring lines. The test control circuit is contained in the integrated circuit device and controls the scan-path.

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