Method for density measurement of mycelium and uses thereof

G - Physics – 01 – N

Patent

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G01N 33/569 (2006.01)

Patent

CA 2537256

The present invention is related to a method for measuring mycelium density, comprising determining the length of mycelium fragments by using a predetermined surface area and dividing the length by the surface area. The present invention is also about measuring growth of mycelium in presence of an active agent, by measuring the density of mycelium in presence of the active agent; and comparing the density with a reference value. The present invention is further about determining the resistance of mycelium to an inhibitor agent by measuring density of mycelium in presence of the inhibitor agent; and determining growth of the mycelium based on its density.

La présente invention concerne un procédé pour mesurer la densité de mycélium, comprenant la détermination de la longueur de fragments de mycélium, par utilisation d'une aire prédéterminée, et division de la longueur par l'aire. L'invention concerne aussi la mesure de la croissance de mycélium en la présence d'un agent actif, par mesure de la densité du mycélium en la présence de l'agent actif, et comparaison de la densité avec une valeur de référence. L'invention a également pour objet la détermination de la résistance de mycélium à un agent inhibiteur, par mesure de la densité de mycélium en la présence de l'agent inhibiteur, et détermination de la croissance du mycélium en se basant sur sa densité.

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