Scanning kelvin microprobe system and process for analyzing...

G - Physics – 01 – Q

Patent

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G01Q 10/00 (2010.01) G01Q 60/30 (2010.01)

Patent

CA 2447929

A scanning Kelvin microprobe (SKM) system capable of measuring and analyzing surface characteristics of samples is provided. Also provided is a process of measuring and analyzing surface characteristics of samples. Further, there are provided uses of the SKM system in measuring and analyzing surface characteristics of conductors, semiconductors, insulators, chemicals, biochemicals, photochemicals, chemical sensors, biosensors, biochemical microarrays, microelectronic devices, electronic imaged devices, micromachined devices, nano-devices, corroded materials, stressed materials, coatings, adsorbed materials, contaminated materials, oxides, thin films, and self assembling monolayers.

L'invention concerne un système de microsonde Kelvin de balayage (SKM) pouvant mesurer et analyser des caractéristiques de surface sur des échantillons. L'invention concerne également un procédé pour mesurer et analyser des caractéristiques de surface sur des échantillons. Cette invention porte également sur les utilisations du système SKM pour mesurer et analyser des caractéristiques de surface sur des conducteurs, des semiconducteurs, des isolants, des produits chimiques, des produits biochimiques, des produits photochimiques, des capteurs chimiques, des biocapteurs, des jeux ordonnés de microéchantillons biochimiques, des appareils de microélectronique, des appareils d'image électronique, des appareils micro-usinés, des nano-appareils, des matériaux corrodés, des matériaux soumis à un stress, des revêtements, des matériaux adsorbés, des matériaux contaminés, des oxydes, des films fins et des monocouches autoassembleuses.

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