Inspection system with specimen preview

Details Inspection system with specimen preview Inspection system with specimen preview

G - Physics

01

N

G01N 15/14 (2006.01) G06F 1/20 (2006.01)

Patent

CA 2295918

A specimen preview and inspection system is disclosed. The system beneficially includes a preview stage, which provides a set of biasing-information for preview by a technician before the technician formally screens the specimen. The preview stage enables the technician to conveniently review information pertinent to the specimen at issue. The preview stage may thereby bias, or channel, the technician's attention during screening toward diagnostically significant aspects of the specimen. The invention is particularly useful in the context of Pap smear screening, although the invention may extend to inspection of other types of specimens or samples as well.

On décrit un système d'inspection et de visualisation des échantillons. Pour plus d'efficacité, le système comprend une première étape qui produit un ensemble d'informations de sélection partielle permettant à un technicien d'effectuer la visualisation avant que ce dernier analyse de manière formelle l'échantillon. L'étape de visualisatin permet au technicien de revoir de manière commode des informations pertinentes relatives à l'échantillon. L'étape de visualisation peut ainsi orienter ou canaliser l'attention du technicien pendant l'analyse de l'échantillon sur des aspects significatifs du point de vue du diagnostic. Cette invention est particulièrement utile dans le contexte des frottis Papanicolaai, cette invention pouvant cependant être étendue à l'inspection d'autres types d'échantillons ou de prélèvements.

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