G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 15/02 (2006.01) G01N 21/53 (2006.01) G01N 33/18 (2006.01)
Patent
CA 2647240
A measurement system having dual measurements capabilities is disclosed. The measurement system has a light source (10) configured to provide light along a first axis that illuminates a sample media (8). The measurement system has a first sensor (5) configured to measure scattered light in a sample media. The measurement system has a second sensor (17) configured to measure light passing through the sample media.
La présente invention concerne un système de mesure doté de deux fonctions de mesure. Le système de mesure comprend une source lumineuse (10) conçue pour produire une lumière sur un premier axe qui éclaire un milieu d'échantillon (8). Le système comprend également un premier capteur (5) conçu pour mesurer une lumière diffusée dans un milieu d'échantillon. Le système comprend enfin un second capteur (17) conçu pour mesurer la lumière traversant le milieu d'échantillon.
Borden Ladner Gervais Llp
Hach Company
LandOfFree
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