G - Physics – 01 – R
Patent
G - Physics
01
R
356/2
G01R 31/28 (2006.01) G01R 31/3181 (2006.01) G01R 31/3185 (2006.01)
Patent
CA 2013248
A test system is associated with a chain of circuits on a circuit board for testing the interconnections linking the circuits in the chain as well as for testing the interconnections linking them to those on other boards. The test system includes a controller for generating a test signal and for capturing a response signal generated by the associated chain of circuits in response to the test signal. The controller also generates a flow control signal which controls a network that routes the test signals from the controller, or from a first other test system, to the associated chain of circuits. In accordance with the flow control signal, the network also serves to route the response signal from the associated chain of circuits to the controller or to a second other test system. By selectively routing the test and response signals, the network in each test system allows individual testing of each associated chain of circuits or, alternatively, permits the chains of circuits on several boards to be effectively interconnected for testing.
Jarwala Najmi T.
Yau Chi W.
American Telephone And Telegraph Company
Kirby Eades Gale Baker
LandOfFree
Method and apparatus for testing circuit boards does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for testing circuit boards, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing circuit boards will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1697605