Time-of-flight mass-spectrometer with gasphase ion source,...

Details Time-of-flight mass-spectrometer with gasphase ion source,... Time-of-flight mass-spectrometer with gasphase ion source,...

H - Electricity

01

J

H01J 49/40 (2006.01) H01J 49/36 (2006.01)

Patent

CA 2127183

Abstract A high particle density in the extraction volume of a gasphase ion source and simultaneously a very low particle density in the driftspace of the time-of-flight mass-spectrometer are necessary for high sensitivity and a large dynamic range of the mass-spectrometer signal output. This can be achieved by separating the time-of-flight mass-spectro- meter into two or more regions of different pressure, connecting the dif- ferent regions by gas flow restrictions. A maximum particle density in the extraction volume and simultaneously a minimal particle density in drift space can be achieved by integrating the gas flow restrictions(3,6) directly into the electrodes(1,2) of the ion source.

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