Detection of a deviation in a material using a spectral camera

Details Detection of a deviation in a material using a spectral camera Detection of a deviation in a material using a spectral camera

G - Physics

01

N

G01N 21/89 (2006.01) G01N 33/00 (2006.01)

Patent

CA 2558184

A method for coding a place in an analyzable material according to a wavelength. In a method according to the invention the light produced by the light source is dispersed as several spectrums to the surface of an analyzable moving planar material, the spectrums reflected from the surface of the analyzable moving planar material are collected, the collected spectrums are guided into a spectrum camera, the spectrums guided into the spectrum camera are compared to a predetermined reference spectrum and the location of one or more deviations in the analyzed material is defined on the basis of comparison.

L'invention concerne un procédé de codage d'un emplacement dans une matière analysable, en fonction d'une longueur d'onde. Selon le procédé de cette invention, la lumière produite par la source de lumière est dispersée sous forme de plusieurs spectres vers la surface d'une matière plane mobile analysable, les spectres réfléchis de ladite surface de cette matière plane mobile analysable sont recueillis, les spectres recueillis sont guidés dans une caméra à spectre, les spectres guidés dans ladite caméra sont comparés à un spectre de référence prédéterminé et l'emplacement d'au moins une déviation dans la matière analysée est défini sur la base de la comparaison.

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