Probe for an extensometer

Details Probe for an extensometer Probe for an extensometer

G - Physics

01

B

G01B 5/30 (2006.01) G01N 33/38 (2006.01)

Patent

CA 2056490

PATENT 13DV-10360 PROBE FOR AN EXTENSOMETER ABSTRACT OF THE DISCLOSURE Disclosed herein are probes for mounting on an extensometer used in conjunction with a materials testing machine, and can be used in high temperature applications. Each probe includes a probe shaft with a tip and a probe support body mounted to a hollow shield tube over the probe shaft. The probe support body includes a tipped segment which is biased toward the tip of the probe shaft. A longitudinal axis passes through the tips and tipped segment, respectively. The hollow shield tube mounted over the probe shaft is made of a high temperature material having a low thermal conductivity coefficient. The sleeve prevents excessive temperature transients from affecting the probe shaft.

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