Method of measuring nonlinearity spatial profiles of samples...

G - Physics – 01 – N

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G01N 21/63 (2006.01) G01J 11/00 (2006.01)

Patent

CA 2495062

A method for measuring a physical function forms a symmetric composite function by combining the physical function with a reference function. The method obtains a Fourier transform of the symmetric composite function. The method calculates an inverse Fourier transform of the obtained Fourier transform, wherein the calculated inverse Fourier transform provides information regarding the physical function. The physical function can be a nonlinearity profile of a sample with at least one sample surface. The physical function can alternatively by a sample temporal waveform of a sample optical pulse.

L'invention concerne un procédé permettant de mesurer une fonction physique consistant à former une fonction composite symétrique par combinaison de la fonction physique avec une fonction de référence. Ce procédé permet d'obtenir une transformation de Fourier de la fonction composite symétrique. Ce procédé consiste à calculer une transformation de Fourier inverse de la fonction de Fourier obtenue, la transformation de Fourier inverse calculée fournissant des informations relatives à la fonction physique. Cette fonction physique peut être un profil de non linéarité d'un échantillon avec au moins une surface d'échantillon. Cette fonction physique peut alternativement consister en forme d'onde temporelle d'échantillon d'une impulsion optique d'échantillon.

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