G - Physics – 01 – N
Patent
G - Physics
01
N
349/42
G01N 29/04 (2006.01)
Patent
CA 2007420
ABSTRACT OF THE DISCLOSURE An ultrasonic flaw detecting method of this invention includes the steps of detecting a surface flaw of an inspecting object having a uniform thickness by causing a probe to scan while emitting ultrasonic waves at a predetermined oblique angle onto the surface of the inspecting object and quantitatively measuring the depth of the surface flaw by a tip echo method. The method of this invention is characterized by abutting an ultrasonic wave shielding member against the surface of the inspecting object in an area between the point of incidence of the ultrasonic waves and the surface flaw, thereby eliminating surface wave which causes parasitic echo on a screen of oscilloscope.
Naruo Kazuteru
Onuma Nobuhiro
Doryokuro Kakunenryo Kaihatsu Jigyodan
Marks & Clerk
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