Method and circuit for collecting memory failure information

Details Method and circuit for collecting memory failure information Method and circuit for collecting memory failure information

G - Physics

11

C

G11C 29/00 (2006.01) G01R 31/3181 (2006.01) G11C 29/40 (2006.01)

Patent

CA 2414632

A method of collecting memory failure information in real time for memories tested using an embedded memory test controller for the purpose of process monitoring, yield enhancement, redundancy analysis and bitmap generation.

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