Method of scanning a sample plate surface mask in an area...

H - Electricity – 01 – J

Patent

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H01J 49/04 (2006.01) B01L 3/00 (2006.01) G01N 1/40 (2006.01) H01J 49/16 (2006.01)

Patent

CA 2524249

A method of scanning a sample plate surface mask in an area adjacent to a conductive area using mass spectrometry is disclosed. The method comprises the steps of providing a sample plate including a mask applied with a rough surface to the electrically conductive surface to produce a sample site comprising a central portion formed from the electrically conductive surface and a marginal portion of the mask, preparing an analyte comprising mixing a biomolecule with an organic solvent, an aqueous solution, and a matrix selected from the group of a-cyano-4-hydroxycinnamic acid and 3,5-dimethoxy-4- hydroxycinnamic acid; applying the analyte to the sample site; forming at least one crystal of the analyte in an area on the mask adjacent to the conductive area, and scanning the area on the mask adjacent to the conductive area with a laser beam.

L'invention porte sur un procédé de balayage du masque de la surface d'une plaque porte-échantillons dans une zone jouxtant une zone conductrice par spectrométrie de masse comportant les étapes suivantes: préparation d'une plaque porte-échantillons comportant un masque rugueux appliqué sur la zone conductrice pour créer un site porte-échantillons comprenant une partie centrale électroconductrice et un pourtour de masque; préparation d'un analyte en mélangeant un solvant organique, une solution aqueuse, une matrice choisi parmi l'acide <i>a</i>-cyano-4-hydroxycinnamique et l'acide 3,5-diméthoxy-4-hydroxycinnamique; application de l'analyte au site porte-échantillons; formation d'au moins un cristal de l'analyte dans la partie du masque jouxtant la zone conductrice; et balayage de ladite partie du masque par un rayon laser.

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