Method and apparatus for connecting manufacturing test...

Details Method and apparatus for connecting manufacturing test... Method and apparatus for connecting manufacturing test...

G - Physics

06

F

G06F 11/00 (2006.01) G06F 13/42 (2006.01)

Patent

CA 2290174

Methods and apparatus are provided for connecting a manufacturing test interface to a global serial bus, such as an inter integrated circuit (I2C) bus. Input/output buffer logic buffers data to be transferred to and from the global serial bus. A slave interface logic connected to the input/output buffer logic receives and sends data to the input/output buffer logic. A slave controller coupled to the input/output buffer logic and the slave interface logic paces data exchange to the input/output buffer logic. Error detection logic is coupled between the input/output buffer and the global serial bus for detecting error conditions.

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