Apparatus for non-destructive testing of dielectric/magnetic...

Details Apparatus for non-destructive testing of dielectric/magnetic... Apparatus for non-destructive testing of dielectric/magnetic...

G - Physics

01

N

G01N 22/00 (2006.01) G01N 27/00 (2006.01) G01N 27/72 (2006.01) G01R 27/26 (2006.01) G01R 33/032 (2006.01)

Patent

CA 2118322

A dielectric probe, of the type in which an electromagnetic wave is reflected from a dielectric/magnetic structure and spectrum analyzed (6), further includes a coil (7) for applying a magnetic field to the structure as the wave is being reflected. Information about the intrinsic electromagnetic properties and structure of the material is obtained by comparing the reflected spectra for both the magnetic field on and off conditions.

Affiliated with

Also associated with

Rating

Apparatus for non-destructive testing of dielectric/magnetic... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for non-destructive testing of dielectric/magnetic..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for non-destructive testing of dielectric/magnetic... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1908238