G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 31/28 (2006.01) G01R 31/3183 (2006.01) G01R 31/3185 (2006.01) G01R 31/3187 (2006.01)
Patent
CA 2351038
n identical integrated circuit blocks are simultaneously tested for defects. Each block contains m scan chains. The i th scan chains in each block are identical (i = 1, 2 , ..., m). During an i th clock cycle, an i th test vector is simultaneously applied to each block's i th scan chain. The resultant n output signals are compared. If all n outputs are equal the i th scan chain is designated defect-free for all n blocks; other- wise, the i th scan chain is designated defective for one or more blocks. After sequentially repeating the test vector application, output compari- son and designation process for i = 1, 2 ,..., m the n blocks are desig- nated defect-free if all m scan chains have been designated defect-free for all n blocks; otherwise, if one or more scan chains have been designated defective for one or more blocks, the n blocks are designated defective.
Oyen Wiggs Green & Mutala Llp
Pmc-Sierra Inc.
LandOfFree
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