Arrangement of analyzer measuring window

Details Arrangement of analyzer measuring window Arrangement of analyzer measuring window

G - Physics

01

N

G01N 23/223 (2006.01)

Patent

CA 2761392

The invention relates to an arrangement of a measuring window in a continuously operated X-ray analyzer (1), said analyzer being is used particularly for analyzing elemental contents in solid, liquid or slurry-like materials; which measuring window (2) separates the sampling space (3) containing the sample material to be measured and the measurement space (4) containing the measuring probe (11), and is sealed by a lid structure (6) arranged in the sampling space, said lid structure outlining the measurement aperture (7) of the sampling space, in which case the lid structure outlining the measurement aperture of the sampling space is provided with a sealing surface (8) of the measuring window, so that said surface is at least partly planar and at least partly curved.

L'invention concerne l'agencement d'une fenêtre de mesure dans un analyseur (1) à rayons X fonctionnant en continu, ledit analyseur étant utilisé en particulier pour analyser des contenus élémentaires dans des matières solides, liquides ou pâteuses; ladite fenêtre (2) de mesure séparant l'espace de prélèvement (3) contenant la matière prélevée à mesurer de l'espace (4) de mesure contenant la sonde (11) de mesure, et étant fermée par une structure (6) de couvercle disposée dans l'espace de prélèvement, ladite structure de couvercle délimitant l'ouverture (7) de mesure de l'espace de prélèvement, auquel cas la structure de couvercle délimitant l'ouverture de mesure de l'espace de prélèvement est dotée d'une surface (8) d'étanchéité de la fenêtre de mesure, de façon que ladite surface soit au moins partiellement plane et au moins partiellement incurvée.

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