G - Physics – 01 – D
Patent
G - Physics
01
D
G01D 5/347 (2006.01) G01B 11/26 (2006.01)
Patent
CA 2517397
In a method according to the invention for the accurate determination of an angle of rotation (w) about an axis (a), at least a part of a plurality of pattern elements (5, ..., 13) arranged around a pattern center (4), a multiplicity of which are arranged one behind the other in a rotation, is at least partly focused by means of optical beams on a multiplicity of detector elements (2) of an optical detector (1) which are arranged in series. The pattern elements (5, ..., 13) are arranged on a rotating body (3) which is connected to the detector (1) so as to be rotatable about the axis (a). Positions (p) of the focused pattern elements are resolved by means of the detector elements (2) of one and the same detector (1) . In a first step, effects of an eccentricity (e) of the pattern center (4) relative to the axis (a) on the determination of an angle of rotation are computationally determined from resolved positions (p) of at least one pattern element (5, ..., 13). In a second step, the angle of rotation (w) is accurately determined from the resolved positions (p1, p2, p3) of pattern elements (5, 6, 7) arranged one behind the other taking into account the effects determined.
Gowling Lafleur Henderson Llp
Leica Geosystems Ag
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