G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 27/90 (2006.01)
Patent
CA 2711129
A method for testing a component using an eddy current array probe is provided. The method includes calibrating the eddy current array probe, collecting data from the eddy current array probe for analysis, and processing the collected data to at least one of compensate for response variations due to a detected orientation of a detected imperfection and to facilitate minimizing noise.
L'invention concerne un procédé pour l'essai d'un composant à l'aide d'une sonde à courant de Foucault. Le procédé comprend l'étalonnage de la sonde à courant de Foucault, le recueil des données provenant de la sonde à courant de Foucault pour une analyse, et le traitement des données recueillies pour compenser les variations de réponse dues à une orientation détectée d'une imperfection détectée et/ou pour faciliter la réduction du bruit à un minimum.
Dewangan Sandeep
Gambrell Gigi
Korukonda Sanghamithra
Mcknight William Stewart
Suh Ui
Company General Electric
Craig Wilson And Company
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