X-ray fluorescent emission analysis to determine material...

G - Physics – 01 – N

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G01N 23/223 (2006.01) B29B 11/00 (2006.01)

Patent

CA 2355742

A method and apparatus is disclosed to determine a concentration of dopant in soot that constitutes at least a portion of a soot preform (12) used to form an optical wave guide. The photon source (30) irradiates the soot preform on a mandrel (14). X-ray fluorescent emissions, from the irradiated soot are detected, and the concentration of dopant is determined based on the detected X-ray fluorescent emissions. Additionally, the concentration of dopant in layers of soot on the preform can be controlled by utilizing the detected X- ray fluorescent emissions to determine a deviation between a concentration of dopant in the soot and a predetermined concentration, and adjusting deposition conditions based on the deviation.

L'invention porte sur un procédé et un appareil visant à déterminer une concentration de dopant dans la suie qui constitue au moins une préforme (12) utilisée pour former un guide d'onde optique. La source (30) de photons irradie la préforme de suie sur un mandrin (14). Des émissions fluorescentes de rayons X provenant de la suie irradiée sont détectées et la concentration de dopant est déterminée en fonction des émissions fluorescentes de rayons X décodées. De plus, la concentration de dopant dans des couches de suie de la préforme peut être contrôlée au moyen des émissions fluorescentes de rayons X détectées afin de déterminer une déviation entre une concentration de dopant dans la suie et une concentration prédéterminée et par ajustement des dépôts en fonction de la déviation.

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