Ion source with device for oxidising a sample

H - Electricity – 01 – J

Patent

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Details

H01J 37/00 (2006.01) G01N 31/12 (2006.01) H01J 49/14 (2006.01)

Patent

CA 2730782

An ion source is disclosed wherein a sample is introduced into the sample chamber (1) of the ion source in the gas phase via a sample introduction capillary tube (2). The sample is directed onto a heated surface (6) coated with an oxidising reagent such as copper oxide. Carbon in the sample is oxidised to form carbon dioxide. The resulting carbon dioxide molecules are then ionised by electron impact ionisation with an electron beam (3) and the resulting ions are passed to a mass analyser for mass analysis.

Linvention concerne une source dions. Selon linvention, un échantillon est introduit dans la chambre déchantillon (1) de la source dions en phase gazeuse via un tube capillaire dintroduction de léchantillon (2). Léchantillon est dirigé sur une surface chauffée (6) enduite avec un réactif oxydant tel que loxyde de cuivre. Le carbone dans léchantillon est oxydé pour former du dioxyde de carbone. Les molécules de dioxyde de carbone résultantes sont ensuite ionisées par ionisation par impact électronique avec un faisceau délectrons (3), et les ions résultants sont transférés vers un analyseur de masse pour une analyse de masse.

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